1)X-ray diffractometerX射线衍射仪
1.A Modification Method of X-Ray Diffractometer Controlled with Microcomputer on Windows XP;X射线衍射仪Windows XP微机化改造新方法
2.We can "see" atom and molecule by single crystal X-ray diffractometer;单晶X射线衍射仪可以让我们“看见”原子和分子
3.Building high grade service sharing platform of X-ray diffractometers to cultivate creative talent;为培养创新人才构筑X射线衍射仪优质资源共享服务平台
英文短句/例句
1.energy dispersive X-ray diffractometer能量扩散X射线衍射仪
2.The microstructure of the film was characterized by X ray diffraction, transmission electron microscopy, and selected area diffraction.用X射线衍射仪、射电镜及其选区衍射来分析薄膜的微结构。
3.Development and Design of 3KW High-frequency High Voltage Generator for X-ray Diffractometer;X射线衍射仪3KW高频高压电源的研究与设计
4.Retained austenite in steel--Quantitative determination--Method of X-ray diffractometerGB/T8362-1987钢中残余奥氏体定量测定X射线衍射仪法
5.The lattice constant determination of metals--Method of X-ray diffractometerGB/T8360-1987金属点阵常数的测定方法X射线衍射仪法
6.Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometerGB/T8359-1987高速钢中碳化物相的定量分析X射线衍射仪法
7.Structure Study of GaN/Al_2O_3 by High Resolution X-ray Diffraction;利用高分辨X射线衍射仪表征GaN/Al_2O_3薄膜结构特性
8.Experience for Using Quality Analysis Software of M03XHF_(22) X-ray Diffraction System;M03XHF_(22)型X射线衍射仪定性相分析软件的使用经验
9.Characterization of Structure of GaN Films by High Resolution X-ray Diffraction Analysis利用高分辨X射线衍射仪表征GaN薄膜的结构特性
10.Study on Effect of Fill-sample Depth on Determination with Polycrystal Powder X-ray Diffractometer填样深度对多晶粉末X射线衍射仪测试结果的影响研究
11.single crystal X-ray diffractometer单晶体x射线衍射仪
12.nondiffraction X-ray spectrometer非衍射x射线光谱仪
13.x ray photoemission diffractionx射线光电发射衍射
14.X-ray Diffractive analysis of Crystal Structure ?X-射线衍射晶体分析
15.X-ray diffraction pattern computerX射线衍射图谱计算机
16.circular X-ray diffraction camera圆形X射线衍射照相机
17.Applications of Polycrystal X-ray Diffraction多晶 X射线衍射应用
18.X-ray fluorescent emission spectrometerX射线荧光发射光谱仪
相关短句/例句
XRDX射线衍射仪
1.Maintenance and Service about the Detecting System of the Cooling Water for XRD in D/max-r Series;D/max-r X射线衍射仪冷却水检测系统的检修
2.The surface morphology,chemical composition,film grain size as well as the film crystallization of particles were analyzed by field emission scanning electron microscopy(FESEM),energy dispersive spectroscopy(EDS),inductively coupled plasma-atom emission spectrometer(ICP-AES) and X-ray diffraction(XRD) respectively before and after the plating process.重点讨论了不同的沉积条件对薄膜结晶的影响,并用X射线衍射仪(XRD)对其进行了表征。
3.The nc-Si films were characterized by the Raman spectroscopy,X-ray dif-fraction spectroscopy(XRD),transmission electron microscopy(TEM) and atom force microscope(AFM),respectively.利用拉曼(Raman)光谱仪、X射线衍射仪(XRD)、透射电子显微镜(TEM)以及原子力显微镜(AFM)等测试仪器对nc-Si薄膜进行表征,发现制备的nc-Si量子点排列紧密、尺寸均匀,具有很好的单晶结构,制备的nc-Si薄膜晶化比例很高,并且优先选择在[111]方向晶化。
3)X-ray diffractionX射线衍射仪
1.Scanning electron microscopy,X-ray diffraction and laser particle size analyzer were used to carry out a micromeasurement of the powder.采用快速凝固/机械球磨法制备钛合金粉末;并采用扫描电子显微镜、X射线衍射仪和激光粒度分析仪对其进行微观测量。
2.According to the results of scanning electron microscope and X-ray diffraction analysis, microstructures are different during laser sintering with different powers; however, sintered materials with nano-structure can be acquired at last.利用电子扫描电镜(SEM)和X射线衍射仪(XRD)对激光烧结纳米Al2O3粉末块体材料进行了试验分析与研究。
3.Basic principle, experiment condition, operating process, method and steps of X-ray diffraction method to determine free silica content of respirable dust in mines are introduced in this paper.本文介绍了应用X射线衍射仪测定矿山呼吸性粉尘中游离二氧化硅含量的基本原理、实验条件以及操作过程、方法步骤等。
4)X ray diffractometerX射线衍射仪
1.Recent achievement in hardware and application of analysis software for new type D8 series X ray diffractometer have been introduced.简要介绍了德国布鲁克 AXS公司新产品 D8系列 X射线衍射仪的特点、实验方法的分析软件及其应用。
2.Users have found it difficult to read data from some X ray diffractometers because of their incompatibility with PC, whereas the X ray diffractometer data capturing system, being run on DOS, has imperfect interactive interface and runs the risk of data missing upon power shutdown.文章介绍利用汇编语言、 C语言、 Borland C++Builder等开发了基于 Windows环境的智能化实时处理软件 ,成功地实现了对原 X射线衍射仪的数据的采集、处理、实时显示和存盘。
5)x-ray diffraction instrumentX射线衍射仪
1.Data controller hardware design of X-Ray diffraction instrument;X射线衍射仪控制器的硬件设计
2.The paper introduced a kind of advanced object shadow analysis method to samples of the crystal or powders with x-ray diffraction instrument,it has exetensive application in field of science and research, as well as practical inspection test.介绍一种用先进的X射线衍射仪对晶体或粉末样品进行物相分析的方法,对科研及常规鉴别试验工作具有较高的推广价值。
6)XRDX射线衍射仪(XRD)
延伸阅读
X射线衍射仪 利用计数器来收集晶体衍射方向和衍射强度数据，进行物相鉴定或晶体结构分析的仪器（图1）。有多晶X射线衍射仪和单晶四圆 X射线衍射仪。X射线衍射仪由X射线发生器、测角仪和探测记录系统等 3部分组成（图2）。其工作原理是：粉末样品经一束平行的单色 X射线垂直照射后，产生一组以入射线为轴的同轴反射圆锥面族，计数管绕样品旋转,依次测量各反射圆锥面2θ角（即衍射角，又称布喇格角）位置的衍射线强度，即可获得表征物相的各种衍射数据，从而进行物相鉴定和晶体结构的研究。 X射线衍射仪是矿物学研究领域内的主要仪器,用于对结晶物质的定性和定量分析，还可确定类质同象混晶（固溶体）的成分，有限固溶体的固溶极限，区分晶质和非晶质结构的变化。测定晶体的有序－无序结构及其有序度，以及粘土矿物的混层结构等。
