X射线衍射谱,XRD英语短句,例句大全

X射线衍射谱,XRD
1)XRDX射线衍射谱
1.The actual surface morphology of AlGaN layer grown by MOCVD was analyzed using XPS and XRD.用X光电子能谱和X射线衍射谱方法分析了MOCVD生长的AlGaN薄膜的实际表面形态和晶体结构基于XPS测量结果 ,通过分析计算 ,发现实际表面除GaN外存在Ga2 O3和Al2 O3及其它与O有关的络合物构成的混合氧化物覆盖层 ,估计覆盖层厚度约 1。
2.By employing X-ray diffraction(XRD) approach,this paper investigated the influences of milling time and Ni content on the samples.用机械合金化方法制备了Fe100-xNix(x=10、20、30、40)系粉末样品,利用X射线衍射谱方法分别研究了球磨时间和Ni含量对样品微结构的影响,结果表明:Fe70Ni30样品经球磨24 h后就形成了过饱和的Fe(Ni)固溶体;经36 h机械球磨后的Fe100-xNix样品Ni含量x(x≤40 at%)越大,越不易形成单一的过饱和固溶体,且越易诱导α-Fe(bcc)产生向γ-Fe(fcc)的结构相变,相变所需的球磨时间愈短;经球磨相同时间80 h后,样品Fe70Ni30有非晶产物生成,而Fe80Ni20仍然是bcc结构的Fe(Ni)饱和固溶体,这表明Ni含量也会影响非晶变化的发生。
2)X ray diffractionX射线衍射谱
1.In this paper,the composition and spectra of Chinaese red granite and sesame white granite are studied by ICP AES,XRF,IR and X ray diffraction.:本文用电感耦合等离子体原子发射光谱法、X荧光光谱法测定了中国红花岗石和芝麻白花岗石的成份、X射线衍射谱及红外光谱。
2.94 buffers are grown on GaAs(100) substrates by molecular beam epitaxy and characterized by X ray diffraction and low temperature photoluminescence.12 )超晶格结构 ,通过 X射线衍射谱和光致发光谱 ,对其结构特性和光学特性进行了研究。
3)X-ray diffractionX射线衍射谱
1.Crystal structures of the GaN epilayers were characterized by X-ray diffraction (XRD), photoluminescence (PL) and Raman scattering.采用快速辐射加热/低压-金属有机化学气相淀积(RTP/LP-MOCVD)方法分别以AlN和阳极氧化铝为缓冲层材料在Si衬底上外延生长GaN薄膜,通过X射线衍射谱(XRD)、光荧光谱(PL)、拉曼散射谱(RamanScattering)等手段对它们的微结构进行了表征和分析,结果指出AlN是优良的缓冲层材料。
4)X-ray diffraction spectrumX射线衍射谱
5)X ray spectraX射线衍射图谱

英文短句/例句

1.X-ray diffraction pattern computerX射线衍射图谱计算机
2.Simulation of Superhard Material C3N4 with X-ray Diffraction Atlas超硬材料C_3N_4的X射线衍射图谱模拟
3.Identification of X-ray Diffraction Fourier Pattern of Fuscoporia Obliqua;桦褐孔菌X射线衍射Fourier图谱的鉴定
4.Studies on X-ray Diffraction Fourier Fingerprint Pattern of Cornu Elaphuri Davidiani麋鹿角的X射线衍射Fourier指纹图谱研究
5.nondiffraction X-ray spectrometer非衍射x射线光谱仪
6.Identification of Cornu Cervi by X-ray Diffraction Fourier Pattern鹿角的X射线衍射Fourier谱鉴别
7.x ray photoemission diffractionx射线光电发射衍射
8.Study on Determination of the Weight Concertration of Free Silicon Dioxide for Dust by Using XRD Technique and the Rietveld Refinement Method;X射线衍射-Rietveld全谱图拟合法测定粉尘中游离SiO_2含量的研究
9.X-ray Comparative Analysis of Rhubarb in Different Production Areas of Qinghai青海不同产区大黄的X-射线衍射图谱研究(摘要)(英文)
10.Identification of national medicine Nest of Macrotermes Annandadei by powder X-ray diffraction Fourier fingerprint pattern土垅大白蚁菌圃的X射线衍射Fourier指纹图谱鉴定研究
11.Construction and application of TCM X-ray diffraction fingerprint expert system grid中药X射线衍射指纹图谱专家系统网格(TCM-XFP-ESG)构建与应用
12.Study on characters of thermal analysis and powder X-ray diffraction patterns of chrysophanol and phscion大黄酚和大黄素甲醚的热分析与X-射线衍射图谱特征
13.X-ray Diffraction Analysis with Fourier Pattern on Qingdai Powder青黛散的X衍射Fourier图谱分析
14.Combined Analysis of Urinary Stones by X-ray Photoelectron Spectroscopy and X-ray Powder Diffraction泌尿系结石的X射线光电子能谱和X射线衍射联合分析
15.X-ray Diffractive analysis of Crystal Structure ?X-射线衍射晶体分析
16.single crystal X-ray diffractometer单晶体x射线衍射仪
17.circular X-ray diffraction camera圆形X射线衍射照相机
18.energy dispersive X-ray diffractometer能量扩散X射线衍射仪

相关短句/例句

X ray diffractionX射线衍射谱
1.In this paper,the composition and spectra of Chinaese red granite and sesame white granite are studied by ICP AES,XRF,IR and X ray diffraction.:本文用电感耦合等离子体原子发射光谱法、X荧光光谱法测定了中国红花岗石和芝麻白花岗石的成份、X射线衍射谱及红外光谱。
2.94 buffers are grown on GaAs(100) substrates by molecular beam epitaxy and characterized by X ray diffraction and low temperature photoluminescence.12 )超晶格结构 ,通过 X射线衍射谱和光致发光谱 ,对其结构特性和光学特性进行了研究。
3)X-ray diffractionX射线衍射谱
1.Crystal structures of the GaN epilayers were characterized by X-ray diffraction (XRD), photoluminescence (PL) and Raman scattering.采用快速辐射加热/低压-金属有机化学气相淀积(RTP/LP-MOCVD)方法分别以AlN和阳极氧化铝为缓冲层材料在Si衬底上外延生长GaN薄膜,通过X射线衍射谱(XRD)、光荧光谱(PL)、拉曼散射谱(RamanScattering)等手段对它们的微结构进行了表征和分析,结果指出AlN是优良的缓冲层材料。
4)X-ray diffraction spectrumX射线衍射谱
5)X ray spectraX射线衍射图谱
6)XRDX射线衍射光谱
1.28 MeV Zn+ ion implantation in the GaInP/GaInAsP quantum well samples was studied by double-crystal high-resolution X-ray diffraction(HRXRD).通过双晶X射线衍射光谱测量,定量地分析了由于离子注入所引起的晶格内应变。