微电子机械系统和使用方法
【专利说明】
[0001] 相关申请的交叉参考
[0002] 本申请是2012年6月13日提交的第61/659, 179号、2012年11月8日提交的 第61/723, 927号、2012年11月9日提交的第61/724, 325号、2012年11月9日提交的第 61/724, 400号、2012年11月9日提交的第61/724, 482号和2012年6月13日提交的第 61/659, 068号美国临时专利申请的非临时申请并且要求所述美国临时专利申请的优先权, 每个美国临时专利申请的整体通过引用结合到本文中。
技术领域
[0003] 本申请涉及微电子机械系统(MEMS)和纳米电子机械系统(NEMS)。
【背景技术】
[0004] 一般在硅(Si)和绝缘体上硅(SOI)晶片上加工微电子机械系统(MEMS),非常像标 准的集成电路那样。然而MEMS装置包括晶片上的移动部分以及电部件。MEMS装置的示例 包括回转仪、加速仪和麦克风。MEMS装置还能够包括执行器,执行器移动以在对象上施加 力。示例包括微机器人操纵器。然而,当加工MEMS装置时,所加工的结构的尺寸经常不匹 配在布局中指定的尺寸。这能够由例如不足的蚀刻或过度的蚀刻引起。
[0005] 对以下文献进行引用:
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[0016] 还对以下文献进行引用:
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[0024] [B8] Stark,R. W.,Drobek,T.,and Heckl,W. M.,2001,"用于原子力显微镜的自由 V 形悬臂的热机械噪声(Thermomechanical Noise of a Free V-Shaped Cantilever for Atomic Force Microscopy)Ultramicroscopy, 86, pp. 201-215.
[0025] [B9]Butt,H. J.,and Jaschke,M.,1995, "原子力显微镜中的热噪声的计算 (Calculation of Thermal Noise in Atomic Force Microscopy)", Nanotechnology, 6(l),pp. 1-7.
[0026] [B10]Levy,R.,and Maaloum,M.,2002,"测量原子力显微镜悬臂的弹簧常量: 热涨落和其他方法(Measuring the Spring Constant of Atomic Force Microscope Cantilevers !Thermal Fluctuations and Other Methods)",Nanotechnology,13(I), pp. 34-37.
[0027] [Bll]Jayich,A.C.,and Shanks,W.E.,2008, "1 开尔文下的悬臂上采样系统 的噪声测温法和电子测温法(Noise Thermometry and Electron Thermometry of a Sample-On-Cantilever System Below IKelvin)",Applied Physics Letters,92 (I), pp. 1-3.
[0028] [B12]Li,F.,and Clark,J. V.,2010,"MEMS的刚度、位移和梳齿驱动器力的实际 测量(Practical Measurements of Stiffness,Displacement,and Comb Drive Force of MEMS) ",EEE UGIM(University Government Industry Micro/nano)Symposium,pp. 1-6.
[0029] [B15]C0MS0L, Inc. 744Cowper Street, Palo Alto, CA 94301, USA, www. comsol. com
[0030] 还对以下文献进行引用:
[0031] [Cl]Gabrielson,T. B.,1993, "微机械声学和振动传感器中的机械热噪声 (Mechanical-Th